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 - **J. Koo**, D. Klabjan, J. Utke, An inverse classification framework with limited budget and maximum number of perturbed samples, Expert Systems With Applications, vol. 212, 2023. [10.1016/j.eswa.2022.118761](https://doi.org/10.1016/j.eswa.2022.118761)
 - L. Lao, S. Kruger, C. Akcay, P. Balaprakash, T Bechtel, E. Howell, **J. Koo**, J. Leddy, M. Leinhauser, Y. Liu, S. Madireddy, J. McClenaghan, D. Orozco, A. Pankin, D. Schissel, S. Smith, X. Sun, S. Williams, and the EFIT-AI Team, Application of Machine Learning and Artificial Intelligence to Extend EFIT Equilibrium Reconstruction, Plasma Physics and Controlled Fusion, vol. 64 (7), 2022. [10.1088/1361-6587/ac6fff](https://doi.org/10.1088/1361-6587/ac6fff)
 - **J. Koo**, S. Hwang, A Unified Defect Pattern Analysis of Wafer Maps Using Density-Based Clustering, IEEE Access, vol. 9, 2021, pp. 78873-78882. [10.1109/ACCESS.2021.3084221](https://doi.org/10.1109/ACCESS.2021.3084221)
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 ### Refereed Proceedings
 - T. Randall\*, **J. Koo\***, B. Videau, M. Kruse, X. Wu, P. Hovland, M. Hall, R. Ge, and P. Balaprakash\*, Transfer-Learning-Based Autotuning Using Gaussian Copula, ACM International Conference on Supercomputing (ICS), 2023, pp. 37-49. [10.1145/3577193.3593712](https://doi.org/10.1145/3577193.3593712) (\*Authors contributed equally to this work)
 - X. Wu, P. Balaprakash, M. Kruse, **J. Koo**, B. Videau, P. Hovland, V. Taylor, B. Geltz, S. Jana, and M. Hall, ytopt: Autotuning Scientific Applications for Energy Efficiency at Large Scales, Cray User Group Conference (CUG), 2023. [10.48550/arXiv.2303.16245](https://arxiv.org/abs/2303.16245)