(Last modified on: {{ "2022-04-13 00:00:00 +0000" | date: '%B %d, %Y' }})
- Type: Bachelor
- Location: SiLab
- Contact: Lars Schall
- Languages: German or English
- Description: Charge measurements in lab experiments and test beam campaigns at particle accelerators produce charge information given in time over threshold (TOT). This value is unique for every chip and front-end setting. In order to express the charge in a common unit (electrons) a charge calibration with various radioactive sources is necessary to relate electrons to TOT. These measurements have to be performed and analysed for multiple LF-Monopix2 chips, including writing software for analysis.